Browse By Department
Woodhead Publishing Electronic and Optic Electromigration in Thin Films and Electronic Devices: Materials and Reliability (Paperback)
Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. Electromigration in Thin Films and Electronic Devices provides an up-to-date review of key...
$291.12 $255.00 Free Delivery
