Pre-Owned The Springer International Engineering and Computer Science: Statistical Modeling for Computer-Aided Design of Mos VLSI Circuits (Hardcover)

Pre-Owned The Springer International Engineering and Computer Science: Statistical Modeling for Computer-Aided Design of Mos VLSI Circuits (Hardcover)

As MOS devices are scaled to meet increasingly demanding circuit specifications process variations have a greater effect on the reliability of circuit performance. For this reason statistical techniques are required to design integrated circuits...


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